The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 19, 2016

Filed:

Mar. 25, 2014
Applicant:

Samsung Display Co., Ltd., Yongin, Gyeonggi-Do, KR;

Inventors:

Min-Ha Hwang, Seoul, KR;

Woong-Kwon Kim, Cheonan-si, KR;

In-Woo Kim, Asan-si, KR;

Seong-Young Lee, Anyang-si, KR;

Kweon-Sam Hong, Asan-si, KR;

Dong-Hyun Yoo, Asan-si, KR;

Beom-Hee Han, Gwangju-si, KR;

Assignee:

SAMSUNG DISPLAY CO., LTD., Yongin, Gyeonggi-Do, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 21/00 (2006.01); H01L 21/84 (2006.01); G02F 1/1345 (2006.01); H04N 5/66 (2006.01); H01L 27/12 (2006.01); H01L 29/417 (2006.01);
U.S. Cl.
CPC ...
H01L 27/124 (2013.01); H01L 29/41733 (2013.01);
Abstract

An array substrate includes a substrate, a plurality of gate lines extending in a first direction on the substrate, a plurality of data lines including first and second data line pairs separated by cutting portions and a plurality of active patterns electrically connected to the first and second data line pairs. The data lines extend in a second direction crossing the first direction. The active patterns overlap the cutting portion and overlap a first gate line.


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