The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 19, 2016

Filed:

Sep. 25, 2013
Applicant:

Siemens Aktiengesellschaft, Munich, DE;

Inventors:

Alban Lefebvre, Jersey City, NJ (US);

Jun Liu, Cary, NC (US);

Edgar Mueller, Heroldsbach, DE;

Mariappan S. Nadar, Plainsboro, NJ (US);

Michaela Schmidt, Uttenreuth, DE;

Michael Zenge, Nuremberg, DE;

Qiu Wang, Princeton, NJ (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 11/00 (2006.01); G01R 33/48 (2006.01); G01R 33/56 (2006.01); G01R 33/561 (2006.01); G01R 33/563 (2006.01);
U.S. Cl.
CPC ...
G06T 11/005 (2013.01); G01R 33/5611 (2013.01); G01R 33/482 (2013.01); G01R 33/4824 (2013.01); G01R 33/5608 (2013.01); G01R 33/5635 (2013.01); G01R 33/56308 (2013.01);
Abstract

A method of image reconstruction for a magnetic resonance imaging (MRI) system having a plurality of coils includes obtaining k-space scan data captured by the MRI system, the k-space scan data being representative of an undersampled region over time, determining a respective coil sensitivity profile for the region for each coil of the plurality of coils, and iteratively reconstructing dynamic images for the region from the k-space scan data via an optimization of a minimization problem. The minimization problem is based on the determined coil sensitivity profiles and redundant Haar wavelet transforms of the dynamic images.


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