The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 19, 2016

Filed:

Mar. 10, 2015
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Shahram Ebadollahi, White Plains, NY (US);

Jimeng Sun, White Plains, NY (US);

Fei Wang, Ossining, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06N 7/00 (2006.01); G06N 99/00 (2010.01); G06F 19/00 (2011.01); G06N 5/04 (2006.01); G06N 5/02 (2006.01);
U.S. Cl.
CPC ...
G06N 7/00 (2013.01); G06F 19/3443 (2013.01); G06N 5/022 (2013.01); G06N 5/04 (2013.01); G06N 5/047 (2013.01); G06N 99/005 (2013.01);
Abstract

A system and method for a composite distance metric leveraging multiple expert judgments includes inputting a data distribution of multiple expert judgments stored on a computer readable storage medium. Base distance metrics are converted into neighborhoods for comparison, wherein each base distance metric represents an expert and each neighborhood represents an individual similarity measure of the expert. The neighborhoods are combined to leverage the local discriminalities of all base distance metrics by applying at least one iterative process to output a composite distance metric.


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