The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 19, 2016

Filed:

May. 29, 2013
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

L. Venkata Subramaniam, New Delhi, IN;

Sameep Mehta, New Delhi, IN;

Raghuram Krishnapuram, Bangalore, IN;

Tanveer A. Faruquie, New Delhi, IN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 15/00 (2006.01); G06F 15/18 (2006.01); G06N 5/02 (2006.01);
U.S. Cl.
CPC ...
G06N 5/02 (2013.01);
Abstract

Techniques, systems, and articles of manufacture for determining related data points from multi-modal inputs. A method includes collecting multiple items of multi-modal data comprising at least one dimension from multiple data sources, wherein said at least one dimension comprises a geographic dimension, a temporal dimension and/or an event-related dimension, determining a window of relevance for each of the multiple items of multi-modal data with respect to the at least one dimension, and identifying two or more of the multiple items of multi-modal data as related, by determining an overlap of the window of relevance corresponding to each of the two or more items of multi-modal data with respect to the at least one dimension.


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