The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 19, 2016
Filed:
Nov. 06, 2013
Tokyo Institute of Technology, Meguro-ku Tokyo, JP;
Osamu Hasegawa, Meguro-ku Tokyo, JP;
Gangchen Hua, Meguro-ku Tokyo, JP;
SOINN HOLDINGS LLC, Tokyo, JP;
Abstract
A place estimation apparatus performs a place estimation process by using position-invariant feature values extracted by a feature value extraction unit. The feature value extraction unit includes local feature value extraction unit that extracts local feature values from each of input images formed from successively-shot successive images, feature value matching unit that obtains matching between successive input images based on the extracted local feature values, corresponding feature value selection unit that selects matched feature values as corresponding feature values, and position-invariant feature value extraction unit that obtains position-invariant feature values based on the corresponding feature values. The position-invariant feature value extraction unit extracts, from among the corresponding feature values, corresponding feature values whose position change is equal to or less than a predetermined threshold as the position-invariant feature values.