The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 19, 2016
Filed:
May. 14, 2015
Canon Kabushiki Kaisha, Tokyo, JP;
Kazuyuki Ishihara, Nagoya, JP;
CANON KABUSHIKI KAISHA, Tokyo, JP;
Abstract
The optical scanning apparatus according to the present invention includes a deflection unit that deflects a light flux, a plurality of incident optical systems that cause light fluxes to enter the deflection unit at different incident angles in a sub-scanning cross section, and an imaging optical system that guides a plurality of light fluxes deflected by the deflection unit onto a scanned surface. The imaging optical system has a first optical functional portion and a second optical functional portion arranged in a sub-scanning direction and connected to each other by a connecting portion. In a plane including the connecting portion, at least incident surfaces or exit surfaces of the first and second optical functional portions overlap with each other at least at one point.