The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 19, 2016

Filed:

Dec. 08, 2014
Applicant:

Oclaro Technology Limited, Northamptonshire, GB;

Inventors:

Neil David Whitbread, Towcester, GB;

Lloyd Nicholas Langley, Northamptonshire, GB;

Andrew Cannon Carter, Northamptonshire, GB;

Assignee:

OCLARO TECHNOLOGY LIMITED, Northamptonshire, GB;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 6/12 (2006.01); G01M 11/00 (2006.01);
U.S. Cl.
CPC ...
G02B 6/12 (2013.01); G01M 11/00 (2013.01); G01M 11/30 (2013.01); G01M 11/33 (2013.01); G02B 2006/12166 (2013.01);
Abstract

Sacrificial optical test structures are constructed upon a wafer of pre-cleaved optical chips for testing the optical functions of the pre-cleaved optical chips. The sacrificial optical structures are disabled upon the cleaving the optical chips from the wafer and the cleaved optical chips can be used for their desired end functions. The test structures may remain on the cleaved optical chips or they may be discarded.


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