The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 19, 2016
Filed:
Jul. 06, 2012
David E. Diller, Greenwood Village, CO (US);
David E. Diller, Greenwood Village, CO (US);
NANOSEIS LLC, Greenwood Village, CO (US);
Abstract
Disclosed herein are various embodiments of methods and systems for optimizing signals generated by microseismic sources, comprising recording microseismic data using patches of geophones, filtering the data to impart a directionality to the data, and performing a source scan to determine the times and locations of microseismic events. The subsurface is divided into a voxel grid that is further subdivided into subgrids. Using a filter designed for each patch-subgrid pair, only data arriving within a predetermined angle of incidence are input to the source scan, thus reducing noise, and enhancing the quality and accuracy of the identified microseismic events. The method is also applicable to data previously recorded with sensor grids or other arrays such as star arrays.