System for reducing peak power during scan shift at the local level for scan based tests

Abstract

A method for performing scan based tests is presented. The method comprises routing scan data serially from a plurality of I/O ports to a plurality of partitions of an integrated circuit using a first clock signal operating at a first frequency, where each partition comprises a plurality of internal scan chains. The method also comprises deserializing the scan data to feed internal scan chains. Further, the method comprises generating a plurality of second clock signals operating at a second frequency using the first clock signal, where each partition receives a respective one of the plurality of second clock signals and where the plurality of second clock signals are staggered where each pulses at a different time. Finally, the method comprises shifting in the scan data into the internal scan chains at the rate of the second frequency.