The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 19, 2016

Filed:

Sep. 05, 2013
Applicant:

Tpk Touch Solutions (Xiamen) Inc., Xiamen, CN;

Inventors:

Yau-Chen Jiang, Hsinchu, TW;

Defa Wu, Jinjiang, CN;

Jianbin Yan, Putian, CN;

Shaoting Lin, Xiamen, CN;

Tsai-Kuei Wei, Hsinchu, TW;

Xiaoxin Bai, Xiamen, CN;

Caijin Ye, Xiamen, CN;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/20 (2006.01); G01R 31/00 (2006.01); G01R 31/04 (2006.01); G01R 31/28 (2006.01); G01R 1/073 (2006.01); G01R 31/02 (2006.01);
U.S. Cl.
CPC ...
G01R 31/04 (2013.01); G01R 1/07342 (2013.01); G01R 31/2818 (2013.01); G01R 31/2889 (2013.01); G01R 31/026 (2013.01);
Abstract

An electrical connection assembly is disclosed. The electrical connection assembly includes a first circuit board and a second circuit board. The first circuit board has a plurality of first signal electrodes and at least one first test electrode, wherein the first signal electrodes and the first test electrode are arranged in a spaced manner on the same side of the first circuit board. The second circuit board has a plurality of second signal electrodes and at least one second test electrode, wherein the second signal electrodes and the second test electrode are arranged in a spaced manner on the same side of the second circuit board, wherein the first signal electrodes are electrically connected to the second signal electrodes and the first test electrode is electrically connected to the second test electrode to form a testing loop.


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