The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 19, 2016
Filed:
Jul. 23, 2010
Applicants:
Takashi Yamato, Kakogawa, JP;
Hiroshi Kurono, Kobe, JP;
Inventors:
Takashi Yamato, Kakogawa, JP;
Hiroshi Kurono, Kobe, JP;
Assignee:
SYSMEX CORPORATION, Kobe-shi, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 35/02 (2006.01); G01N 35/00 (2006.01); G05D 3/12 (2006.01); G01N 35/10 (2006.01);
U.S. Cl.
CPC ...
G01N 35/025 (2013.01); G01N 35/0092 (2013.01); G01N 35/1011 (2013.01); G05D 3/12 (2013.01); Y10T 436/25 (2015.01);
Abstract
A specimen processing apparatus comprising: a specimen processing section which includes a movable section and processes a specimen by moving the movable section; and a controller for determining whether the movable section was moved while a specimen processing operation by the specimen processing section was stopped, and controlling the specimen processing section to perform a preparing operation for starting the specimen processing operation based on the determination result, is disclosed. A control method for a specimen processing apparatus is also disclosed.