The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 19, 2016

Filed:

Jul. 23, 2014
Applicant:

SY Kessler Sales, Inc., Dallas, TX (US);

Inventors:

Daniel L. Kessler, Dallas, TX (US);

Henry M. Kessler, Dallas, TX (US);

Assignee:

Sy Kessler Sales, Inc., Dallas, TX (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 27/08 (2006.01); G01N 33/38 (2006.01); G01N 27/04 (2006.01); G01N 25/18 (2006.01); G10L 21/00 (2013.01); G01N 33/24 (2006.01);
U.S. Cl.
CPC ...
G01N 33/381 (2013.01); G01N 25/18 (2013.01); G01N 27/041 (2013.01); G10L 21/00 (2013.01); G01N 33/24 (2013.01);
Abstract

A gem tester for testing a gem under test and a kit including a horizontal recharging stand are disclosed. In one embodiment of the gem tester, an elongated body has a line-of-sight contour tapering from a bulbous end to a radially deviating frontal nose having a probe extending therefrom. Internal circuitry measures electrical conductivity of the gem under test in order to identify the type of gem under test and drive a color control signal in response thereto. A light source is disposed proximate the probe in order to expose the gem under test to ultraviolet light prior to the internal circuitry measuring electrical conductivity. Identification of the gem under test may be made by audio or visual indication or a combination thereof.


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