The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 19, 2016

Filed:

Jan. 30, 2014
Applicant:

GE Medical Systems Global Technology Company, Llc, Waukesha, WI (US);

Inventors:

Xianjun Pan, Beijing, CN;

Shutao Liu, Chengdu, CN;

Dong Zhang, Chengdu, CN;

Bin Wang, ChengDu, CN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 23/04 (2006.01); A61B 6/03 (2006.01); A61B 6/06 (2006.01); G21K 1/02 (2006.01);
U.S. Cl.
CPC ...
G01N 23/046 (2013.01); A61B 6/032 (2013.01); A61B 6/06 (2013.01); G01N 2223/419 (2013.01); G21K 1/02 (2013.01);
Abstract

A CT imaging system and a method for determining a CT collimator slit profile. The method includes determining a profile of two opposite edges of the collimator slit in a longitudinal direction thereof based on the following: a vertical distance between a focus of a radiation source to the collimator slit, a vertical distance between the focus and the radiation detector, an inclination angle between adjacent detector elements, a length of each detector element, a desired width of projection on the radiation detector by the radiation rays passing through the slit whose longitudinal edge profile is to be determined, and an offset angle of a connecting line from a point on a longitudinal center line of the slit to the focus relative to a plane passing said focus and perpendicular to the slit.


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