The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 19, 2016

Filed:

Oct. 15, 2014
Applicant:

Sri Rama Prasanna Pavani, Palo Alto, CA (US);

Inventor:

Sri Rama Prasanna Pavani, Palo Alto, CA (US);

Assignee:

Exnodes Inc., Palo Alto, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/95 (2006.01); G01N 21/88 (2006.01);
U.S. Cl.
CPC ...
G01N 21/9501 (2013.01); G01N 21/8851 (2013.01); G01N 2201/06113 (2013.01); G01N 2201/12 (2013.01);
Abstract

A system and method for inspecting a surface, comprising: illuminating a region of said surface, with said region having an aspect ratio larger than unity; capturing an image of scattered radiation originating from said region; and computing electromagnetic field of said scattered radiation from said image of scattered radiation and generating an image of region by computational propagation of said electromagnetic field through a predetermined distance, whereby features of said region are captured in said image of region.


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