The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 19, 2016
Filed:
Jun. 09, 2014
Yoshihiro Harada, Kanagawa, JP;
Yoshihiro Harada, Kanagawa, JP;
RICOH COMPANY, LTD., Tokyo, JP;
Abstract
An infiltration measuring device includes a light source, an optical splitter to split a light beam from the light source into a reference light beam and a measuring light beam, a reference optical system provided in an optical path of the reference light beam, a measuring optical system provided in an optical path of the measuring light beam to measure a target object, an optical combiner to combine an optical feedback from the target object with a light beam from the reference optical system, a detector to detect the light beam combined by the optical combiner and convert the combined light beam into a photoelectric conversion signal, an imager to image a cross section of the target object on the basis of the photoelectric conversion signal, a display to display a cross-sectional image formed by the imager, and an applicator to apply an infiltrative material onto the target object.