The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 19, 2016
Filed:
Nov. 28, 2011
Stefano Bernard, Orbassano, IT;
Giuseppe Varalda, Orbassano, IT;
Stefano Bernard, Orbassano, IT;
Giuseppe Varalda, Orbassano, IT;
C.R.F. SOCIETA CONSORTILE PER AZIONI, Orbassano (Turin), unknown;
Abstract
A method for determining the bidirectional reflectance distribution function of a generally plane rough surface of a specimen made of a given material includes acquiring a refractive index of the material, the spectrum of total reflectance measured on the specimen, and the geometry of the profile of the surface. The geometry is determined by: detecting the height and approximating the surface of the specimen as a distribution of plane triangular microfaces. For each direction of incidence of the light on the surface of the specimen and for each direction of observation there is determined the angular orientation of the microfaces contributing to reflecting in a specular way the light incident in the direction of observation. The Fresnel factor defining the specular reflectance of each microface is determined. The total BRDF is determined as the sum of a Lambertian component and of a specular component.