The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 19, 2016
Filed:
Jul. 03, 2013
General Electric Company, Schenectady, NY (US);
Robert Michael Petroskie, Roebuck, SC (US);
General Electric Company, Schenectady, NY (US);
Abstract
A method and system of tolerance testing a component using data measurements from a single test setup within a test apparatus are described. The method includes receiving the data measurements obtained with the single test setup. The method also includes separating, at the processor, the data measurements from a relative positioning of an element of the test apparatus and performing, at the processor, a virtual setup of the component to obtain additional data measurements related to one or more parts of the component. The method additionally includes determining, at the processor, whether a parameter associated with the one or more parts meets a specified tolerance based on the additional data measurements obtained from the virtual setup.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile