The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 19, 2016

Filed:

Sep. 22, 2011
Applicants:

Umpei Kurokawa, Pittsburgh, PA (US);

Cheng-chun Chang, New Taipei, TW;

Byung Ii Choi, Pittsburgh, PA (US);

Inventors:

Umpei Kurokawa, Pittsburgh, PA (US);

Cheng-Chun Chang, New Taipei, TW;

Byung Ii Choi, Pittsburgh, PA (US);

Assignee:

NANOLAMBDA, INC., Pittsburgh, PA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 3/12 (2006.01); G01J 3/28 (2006.01);
U.S. Cl.
CPC ...
G01J 3/12 (2013.01); G01J 3/28 (2013.01); G01J 3/2823 (2013.01);
Abstract

Miniature spectrometers produce low resolution spectral data due to their size limitations. A method for processing these spectral data is proposed. The spectral data from a low resolution spectrometer is enhanced to a higher resolution, or processed to be in the wavelength domain. This process is called spectrum reconstruction, and can be used in low cost and miniature spectrometers with limited spectral resolution. The proposed method is noise robust, adapts to input spectrum, and can be used across many types of spectrometric devices without any manual adjustment of parameters.


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