The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 19, 2016
Filed:
Nov. 30, 2007
Applicants:
Armin Wernet, Rheinfelden, DE;
Roland Dieterle, Lorrach, DE;
Inventors:
Armin Wernet, Rheinfelden, DE;
Roland Dieterle, Lorrach, DE;
Assignee:
ENDRESS + HAUSER GMBH + CO. KG, Maulburg, DE;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/20 (2006.01); G01F 23/24 (2006.01); G01F 23/26 (2006.01); C12Q 1/00 (2006.01);
U.S. Cl.
CPC ...
G01F 23/24 (2013.01); G01F 23/26 (2013.01); C12Q 1/00 (2013.01); C12Q 2304/00 (2013.01); G01N 2201/00 (2013.01);
Abstract
An apparatus for determining and/or monitoring at least one process variable of a medium. The apparatus includes at least one probe unit and at least one electronics unit, which supplies the probe unit with an electrical, exciter signal and which receives from the probe unit an electrical, measurement signal. The invention includes, that the probe unit has at least one inner electrode and at least one outer electrode surrounding the inner electrode.