The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 19, 2016

Filed:

May. 18, 2012
Applicant:

Michael T. Hanchett, Lynnwood, WA (US);

Inventor:

Michael T. Hanchett, Lynnwood, WA (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01C 25/00 (2006.01);
U.S. Cl.
CPC ...
G01C 25/00 (2013.01);
Abstract

A process for calibrating and correcting errors in laser measurement systems in situ, either remotely over the Internet or where the laser measurement system is physically located. In one embodiment, a number of targets are arrayed around the scanner and read by the software of a system. The laser scanner is rotated 180 degrees and the positions of the targets are read again. A correction factor is determined by calculation and displayed to show the expected improvement in accuracy of the laser measurement system. In a second embodiment, the laser scanner is positioned under a vehicle with targets at reference positions for which the measurements are known. The scanner readings are checked against the known values and a correction factor developed. This could be applied on a one-time basis or it can be programmed in the host computer where evaluation and compensation occur automatically.


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