The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 19, 2016
Filed:
Jul. 21, 2005
Juergen Weese, Aachen, DE;
Sabine Mollus, Aachen, DE;
Raoul Florent, Ville d'Avray, FR;
Lucile Nosjean, Rueil-Malmaison, FR;
Pierre Lelong, Nogent sur Marne, FR;
Peter Maria Johannes Rongen, Eindhoven, NL;
Juergen Weese, Aachen, DE;
Sabine Mollus, Aachen, DE;
Raoul Florent, Ville d'Avray, FR;
Lucile Nosjean, Rueil-Malmaison, FR;
Pierre Lelong, Nogent sur Marne, FR;
Peter Maria Johannes Rongen, Eindhoven, NL;
Koninklijke Philips N.V., Eindhoven, NL;
Abstract
A method and an image processing system for the evaluation of projection images generated by an X-ray imaging system, wherein the images may show different instruments of a given set of interventional instruments like catheters or guide wires. The instruments are equipped with markers such that their configuration is characteristic of the corresponding instrument. Preferably three markers are arranged on a straight line, the ratio of the distances between them being characteristic for the corresponding instrument. The image processing system may then identify the instruments present in a given projection and provide functionalities for a user that correspond to said instruments. Moreover, the system may be used to locate an instrument of interest in a projection image if the marker configuration of that instrument is known a priori.