The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 12, 2016
Filed:
Dec. 01, 2014
Applicant:
Fluke Corporation, Everett, WA (US);
Inventors:
Wonoh Kim, Johns Creek, GA (US);
Randy Fischer, Flowery Branch, GA (US);
Douglas E. Bain, Braselton, GA (US);
Assignee:
Fluke Corporation, Everett, WA (US);
Primary Examiner:
Int. Cl.
CPC ...
H04W 24/00 (2009.01); H04W 24/08 (2009.01); H04B 7/26 (2006.01); H04W 24/04 (2009.01); H04W 24/06 (2009.01);
U.S. Cl.
CPC ...
H04W 24/08 (2013.01); H04B 7/2643 (2013.01); H04W 24/04 (2013.01); H04W 24/06 (2013.01);
Abstract
A method for detecting passive intermodulation (PIM) using a PIM analyzing device is provided. The PIM analyzing device transmits two signals comprising first and second signals over a signal transmission medium. The PIM analyzing device receives reflected signals associated with the transmitted signals. The PIM analyzing device determines whether the frequencies of the received signals correspond to the calculated PIM signal frequencies.