The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 12, 2016

Filed:

Jul. 29, 2011
Applicants:

Steffen Neidhardt, Dorfen, DE;

Christian Evers, Kirchheim, DE;

Inventors:

Steffen Neidhardt, Dorfen, DE;

Christian Evers, Kirchheim, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2011.01); H04B 17/00 (2015.01);
U.S. Cl.
CPC ...
H04B 17/0085 (2013.01);
Abstract

A method for determining the place of origin of a passive intermodulation product excites a distributed device under test with two first excitation signals (x(t), x(t), each with a single spectral line, of which the frequencies (f, f) provide a frequency spacing relative to one another. Following this, the phase (φ) of a first passive intermodulation product generated at the place of origin in the distributed device under test from the first excitation signals ((x(t), x(t)) by nonlinear distortion is measured, and the delay time of the first passive intermodulation product from the place of origin to the measuring device is calculated from the measured phase (x(t), x(t)) and the frequency (2·f−f) of the first passive intermodulation product. Finally, the place of origin of the passive intermodulation product is determined from the delay time and the topology of the distributed device under test.


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