The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 12, 2016

Filed:

Apr. 12, 2013
Applicant:

Mitsui Mining & Smelting Co., Ltd., Tokyo, JP;

Inventors:

Atsushi Koike, Saitama, JP;

Yasunori Tabira, Saitama, JP;

Ryuichi Sato, Saitama, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/34 (2006.01); C30B 29/36 (2006.01); C30B 33/00 (2006.01); H01L 21/02 (2006.01); C09K 3/14 (2006.01); H01L 29/16 (2006.01); H01L 21/321 (2006.01);
U.S. Cl.
CPC ...
H01L 29/34 (2013.01); C09K 3/1463 (2013.01); C30B 29/36 (2013.01); C30B 33/00 (2013.01); H01L 21/02024 (2013.01); H01L 21/3212 (2013.01); H01L 29/1608 (2013.01);
Abstract

A single crystal SiC substrate capable of forming a good epitaxial thin film thereon to give a high-quality epitaxial substrate is provided. The single crystal SiC substrate has a CMP-treated surface and has 5 or fewer lattice defects measuring 30 nm or more in a direction parallel to the polished surface and 50 nm or more in a direction perpendicular to the polished surface as counted within a depth of 100 nm from the polished surface in a direction perpendicular to the polished surface and a length of 10 μm in a direction parallel to the polished surface when observed in cross-section using a transmission electron microscope under the 00L reflection or the h-h0 reflection, where L and h are each an integer other than 0.


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