The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 12, 2016
Filed:
May. 30, 2012
Applicant:
Wei LI, Princeton, NJ (US);
Inventor:
Wei Li, Princeton, NJ (US);
Assignee:
Siemens Aktiengesellschaft, Munich, DE;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 15/00 (2011.01); G06T 15/08 (2011.01); G06T 17/20 (2006.01);
U.S. Cl.
CPC ...
G06T 17/205 (2013.01); G06T 15/08 (2013.01); G06T 15/00 (2013.01);
Abstract
A method that includes receiving vertices of a mesh, wherein the mesh represents a volume of interest (VOI) from an original volume, performing a transformation operation on the mesh, wherein the transformation operation transforms vertices of the mesh, obtaining sampling locations of the original volume using the transformed vertices, performing an inverse transformation on the transformed vertices of the mesh and the sampling locations, and performing a ray casting on the original volume to produce an image, wherein the ray casting uses the transformed vertices and a result of the inverse transformation as input.