The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 12, 2016

Filed:

Jul. 29, 2014
Applicant:

Samsung Medison Co., Ltd., Gangwon-Do, KR;

Inventor:

Jun-Sang Yoo, Gangwon-Do, KR;

Assignee:

SAMSUNG MEDISION CO., LTD., Hongcheon-Gun, Gangwon-Do, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 11/60 (2006.01); G06T 7/60 (2006.01); G06T 11/00 (2006.01); G06T 15/40 (2011.01); G09G 5/02 (2006.01); G09G 5/14 (2006.01); G06F 3/048 (2013.01); H04N 5/44 (2011.01); G06F 19/00 (2011.01);
U.S. Cl.
CPC ...
G06T 11/60 (2013.01); G06F 19/3406 (2013.01); G06T 7/60 (2013.01); G06T 11/001 (2013.01); G06T 2210/41 (2013.01);
Abstract

Provided is a method of displaying additional information related to a measured value of an object, which includes acquiring measurement item information of the object; acquiring at least one of a measurement point and a measurement direction for the object; determining a reference value for a measurement based on the acquired measurement item information; acquiring the measured value of the object based on the at least one of the measurement point and the measurement direction; and displaying additional information including the determined reference value and the acquired measured value.


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