The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 12, 2016

Filed:

May. 27, 2011
Applicant:

Herman Scherling, Kokkedal, DK;

Inventor:

Herman Scherling, Kokkedal, DK;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 7/00 (2011.01); H04N 5/228 (2006.01); H04N 5/232 (2006.01); G06T 11/60 (2006.01); G06T 7/00 (2006.01); H04N 5/262 (2006.01); G06T 3/40 (2006.01); G02B 13/06 (2006.01); G03B 17/17 (2006.01); G03B 37/04 (2006.01);
U.S. Cl.
CPC ...
G06T 11/60 (2013.01); G06T 3/4038 (2013.01); G06T 7/0085 (2013.01); H04N 5/23238 (2013.01); H04N 5/2624 (2013.01); G02B 13/06 (2013.01); G03B 17/17 (2013.01); G03B 37/04 (2013.01);
Abstract

An apparatus, a method and a computer program are provided. The method includes analyzing first and second images, the first image being captured by a first image sensor portion and the second image being captured by a second image sensor portion, wherein at least one position on the first and second images, at which the analysis of the first and second images is initiated, depends upon at least one contextual characteristic; determining, from the analysis of the first and second images, an overlapping capture region for the first image sensor portion and the second image sensor portion; and stitching the first and second images together using the overlapping capture region.


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