The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 12, 2016
Filed:
Jan. 20, 2012
Youngil Kwon, Yongin-si, KR;
Byoungkuk Kim, Yongin-si, KR;
Jinseo Park, Yongin-si, KR;
Taewon Kim, Yongin-si, KR;
Youngseok Song, Yongin-si, KR;
Inhwan Sul, Yongin-si, KR;
Kiyeon JO, Yongin-si, KR;
Youngil Kwon, Yongin-si, KR;
Byoungkuk Kim, Yongin-si, KR;
Jinseo Park, Yongin-si, KR;
Taewon Kim, Yongin-si, KR;
Youngseok Song, Yongin-si, KR;
Inhwan Sul, Yongin-si, KR;
Kiyeon Jo, Yongin-si, KR;
Samsung SDI Co., Ltd., Gyeonggi-do, KR;
Abstract
A system for image analysis and a method thereof are disclosed. In one embodiment, the system includes a detector configured to receive an image of a sample, isolate particles from a background image of the sample image and detect positions of the isolated particles and a first operator configured to calculate a static degree of randomness values of the particles using Lennard-Jones potentials based on the detected positions. The system may further include a second operator configured to obtain a dynamic degree of randomness values of particles based at least in part on the sum of tensile forces between particles by implicit integration added until the particles reach a dynamic equilibrium, and calculate a positional degree of randomness of particles based at least in part on subtraction of the dynamic degree of randomness values from the static degree of randomness values.