The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 12, 2016
Filed:
Mar. 05, 2013
International Business Machines Corporation, Armonk, NY (US);
Christoph Lingenfelder, Herrenberg, DE;
Pascal Pompey, Nanterre, FR;
Olivier Verscheure, Dunboyne, IE;
Michael Wurst, Stuttgart, DE;
International Business Machines Corporation, Armonk, NY (US);
Abstract
Techniques for iterative feature extraction using domain knowledge are provided. In one aspect, a method for feature extraction is provided. The method includes the following steps. At least one query to predict at least one future value of a given value series based on a statistical model is received. At least two predictions of the future value are produced fulfilling at least the properties of 1) each being as probable as possible given the statistical model and 2) being mutually divert (in terms of numerical distance measure). A user is queried to select one of the predictions. The user may be queried for textual annotations for the predictions. The annotations may be used to identify additional covariates to create an extended set of covariates. The extended set of covariates may be used to improve the accuracy of the statistical model.