The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 12, 2016

Filed:

Mar. 07, 2013
Applicant:

Nec Corporation, Tokyo, JP;

Inventors:

Maki Sano, Tokyo, JP;

Yoshiko Yoshihara, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 7/00 (2006.01); G01N 15/14 (2006.01); G01N 15/10 (2006.01);
U.S. Cl.
CPC ...
G06K 9/0014 (2013.01); G01N 15/1475 (2013.01); G06T 7/0012 (2013.01); G06T 7/0081 (2013.01); G06T 7/0091 (2013.01); G01N 2015/1006 (2013.01); G06T 2207/20021 (2013.01); G06T 2207/20036 (2013.01); G06T 2207/30096 (2013.01); G06T 2207/30224 (2013.01); G06T 2207/30242 (2013.01);
Abstract

A partial image extracting unit extracts images of a predetermined size and constant magnification from a tissue region. A mask generating unit generates a mask for removing a region not intended for measurement from the tissue region for each extracted image. A complete mask generating unit generates a temporary complete mask in which the masks generated for each of the images are integrated together, and generates a complete mask in which close portions among unmasked portions in the temporary complete mask are unified into one or more target regions. A measuring unit measures information pertaining to an object to be measured included in the image, and this information is measured for each of the images extracted by the partial image extracting unit. A region information calculating unit calculates, for each target region, information pertaining to the object to be measured from the measured information and from the complete mask.


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