The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 12, 2016

Filed:

May. 31, 2013
Applicant:

Samsung Electronics Co., Ltd., Suwon, Gyeonggi-Do, KR;

Inventors:

Gokay Saldamli, San Jose, CA (US);

Richard Chow, Sunnyvale, CA (US);

Hongxia Jin, San Jose, CA (US);

Bart Knijnenburg, Irvine, CA (US);

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 21/60 (2013.01); G06F 21/62 (2013.01); H04L 9/00 (2006.01);
U.S. Cl.
CPC ...
G06F 21/60 (2013.01); G06F 21/6254 (2013.01); H04L 9/008 (2013.01);
Abstract

A system for equality testing, the system comprising a first client device including a first private data unit, a second client device including a second private data unit, and a server. The server receives a first obfuscated data unit corresponding to the first private data unit from the first client device, and a second obfuscated data unit corresponding to the second private data unit from the second client device. The server performs a vector calculation based on the first and second obfuscated data units to generate a combination of the first and second obfuscated data units. The server sends the combination to the first client device. The first client device is configured to determine whether the first private data unit is equal to the second private data unit based on the combination.


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