The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 12, 2016

Filed:

Jun. 03, 2014
Applicant:

Globalfoundries Inc., Grand Cayman, KY;

Inventors:

Evgeny Beskrovny, Ramat Gan, IL;

Alexander Landa, Haifa, IL;

Omer Tripp, Bronx, NY (US);

Assignee:

GLOBALFOUNDRIES INC., Grand Cayman, KY;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 12/14 (2006.01); G06F 12/16 (2006.01); G08B 23/00 (2006.01); G06F 21/57 (2013.01); H04L 29/06 (2006.01); G06F 11/36 (2006.01); H04L 12/24 (2006.01);
U.S. Cl.
CPC ...
G06F 21/577 (2013.01); H04L 63/1433 (2013.01); G06F 11/3668 (2013.01); G06F 11/3672 (2013.01); H04L 41/28 (2013.01);
Abstract

Optimized testing of vulnerabilities in an application implemented by a method includes generating a first probe directed to determine whether an application is vulnerable to a first type of attack; analyzing one or more responses from the application based on the application responding to the first probe; in response to determining that the one or more responses from the application validate a first hypothesis about one or more vulnerabilities associated with the application, and generating at least a second probe to further verify the first hypothesis. The second probe focuses on discovering additional details about the application's vulnerabilities to the first type of attack or a second type of attack.


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