The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 12, 2016
Filed:
Nov. 22, 2013
Applicant:
Microlab Devices Limited, Yeadon, Leeds, GB;
Inventors:
Thomas Oliver Myers, Leeds, GB;
Thomas Oliver Davies, Rugby, GB;
Assignee:
MICROLAB DEVICES LIMITED, , GB;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/00 (2006.01); G06F 19/00 (2011.01); G06T 7/00 (2006.01); G01N 21/84 (2006.01);
U.S. Cl.
CPC ...
G06F 19/366 (2013.01); G01N 21/8483 (2013.01); G06T 7/0012 (2013.01);
Abstract
Embodiments of the present invention provide a method of analyzing a response of an analyte test device, comprising recording, by a device reading device, an image of coded test information associated with the test device, determining, based directly on the image of the test information, one or more test parameters, recording, by the reading device, an image of one or more optically responsive portions of the test device, and determining the response of the test device based on the one or more test parameters and the image of the one or more optically responsive portions of the test device.