The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 12, 2016

Filed:

Nov. 11, 2010
Applicants:

Paul Reed Smith, Annapolis, MD (US);

Jack W. Smith, Belle Haven, VA (US);

Ernestine M. Smith, Belle Haven, VA (US);

Frederick M. Slay, Okatie, SC (US);

Inventors:

Paul Reed Smith, Annapolis, MD (US);

Jack W. Smith, Belle Haven, VA (US);

Frederick M. Slay, Okatie, SC (US);

Assignee:

Digital Harmonic LLC, Ellicott City, MD (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/14 (2006.01); G10L 25/00 (2013.01); G10L 25/18 (2013.01);
U.S. Cl.
CPC ...
G06F 17/141 (2013.01); G06F 17/14 (2013.01); G10L 25/00 (2013.01); G10L 25/18 (2013.01);
Abstract

The invention consists of new ways of constructing a Measuring Matrices (MMs) including time deconvolution of Digital Fourier Transforms DFTs. Also, windowing functions specifically designed to facilitate time deconvolution may be used, and/or the DFTs may be performed in specific non-periodic ways to reduce artifacts and further facilitate deconvolution. These deconvolved DFTs may be used alone or correlated with other DFTs to produce a MM.


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