The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 12, 2016
Filed:
May. 06, 2013
Microsoft Corporation, Redmond, WA (US);
Arun Mathew Abraham, Redmond, WA (US);
Haiying Xu, Redmond, WA (US);
Jun Su, Redmond, WA (US);
Peter Gerard Provost, Denver, CO (US);
Jing Fan, Redmond, WA (US);
Jean-Marc Prieur, Ollioules, FR;
Microsoft Technology Licensing, LLC, Redmond, WA (US);
Abstract
The present invention extends to methods, systems, and computer program products for identifying impacted tests from statically collected data. In general, static dependency data, possibly augmented with some dynamic data, is used to find an appropriate set of impacted tests for code changes. In some embodiments, static dependency analysis is used to identify tests impacted by a code change. Heuristics can be used to assist with identifying an appropriate set of impacted tests to run for a code change. Dynamic data can be used to augment static dependency data to identify more optimal sets of impacted tests to run for a code change.