The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 12, 2016
Filed:
Jan. 13, 2014
Applicant:
International Business Machines Corporation, Armonk, NY (US);
Inventors:
Philip G. Emma, Danbury, CT (US);
Allan M. Hartstein, Chappaqua, NY (US);
Michael B. Healy, White Plains, NY (US);
Krishnan K. Kailas, Tarrytown, NY (US);
Alper Buyuktosunoglu, White Plains, NY (US);
Assignee:
International Business Machines Corporation, Armonk, NY (US);
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2006.01);
U.S. Cl.
CPC ...
G06F 9/4403 (2013.01); G06F 9/44 (2013.01);
Abstract
Three-dimensional processing systems are provided which have multiple layers of conjoined chips, wherein at least one chip layer has calibration control circuitry that is dedicated to calibrating/configuring one or more functional chip layers, and/or performance instrumentation control circuitry for testing and collecting performance data of one or more functional chip layers.