The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 12, 2016
Filed:
Apr. 10, 2013
Boe Technology Group Co., Ltd., Beijing, CN;
Beijing Boe Optoelectronics Technology Co., Ltd., Beijing, CN;
BOE TECHNOLOGY GROUP CO., LTD., Beijing, CN;
BEIJING BOE OPTOELECTRONICS TECHNOLOGY CO., LTD., Beijing, CN;
Abstract
The present disclosure provides an array substrate comprising a structure to be detected disposed on a base substrate. An additional layer for detecting the structure to be detected is broken is disposed below the structure to be detected. The additional layer has a color different from that of the structure to be detected and a same pattern shape as that of the structure to be detected. The present disclosure also provides a detecting method and detecting apparatus of the array substrate described above. According to the array substrate, the detecting method and the detecting apparatus of the present disclosure, an early detection of the breakage defect occurred during the fabrication process of the array substrate can be achieved so as to discover and eliminate those defects as early as possible, which improves throughput and yield.