The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 12, 2016
Filed:
Jun. 15, 2012
Jonas Fölling, Heidelberg, DE;
Jonas Fölling, Heidelberg, DE;
Leica Microsystems CMS GmbH, Wetzlar, DE;
Abstract
A sequence of individual images is acquired by imaging the sample through imaging optics onto an image sensor. For the acquisition of each individual image, the sample is provided with a marker pattern, in which individual markers can be imaged in the form of spatially separable light distributions through the imaging onto the image sensor. The centroid positions of the light distributions are determined and superimposed to form a complete image of the sample. According to the present invention, an image-drift-inducing temperature value (ΔT, ΔT, . . . , ΔTn) is measured during the acquisition of the sequence of individual images. A temperature-dependent drift value (ΔX, ΔX, . . . , ΔXn; ΔY, ΔY, . . . , ΔYn) is correlated to the image-drift-inducing temperature value (ΔT, ΔT, . . . , ΔTn) based on predetermined correlation data. The determined centroid positions are corrected based on the drift value (ΔX, ΔX, . . . , ΔXn; ΔY, ΔY, . . . , ΔYn).