The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 12, 2016
Filed:
Oct. 29, 2015
Sandia Corporation, Albuquerque, NM (US);
Mary M. Moya, Albuquerque, NM (US);
Mark W. Koch, Albuquerque, NM (US);
Sandia Corporation, Albuquerque, NM (US);
Abstract
Various embodiments presented herein relate to identifying one or more edges in a synthetic aperture radar (SAR) image comprising a plurality of superpixels. Superpixels sharing an edge (or boundary) can be identified and one or more properties of the shared superpixels can be compared to determine whether the superpixels form the same or two different features. Where the superpixels form the same feature the edge is identified as an internal edge. Where the superpixels form two different features, the edge is identified as an external edge. Based upon classification of the superpixels, the external edge can be further determined to form part of a roof, wall, etc. The superpixels can be formed from a speckle-reduced SAR image product formed from a registered stack of SAR images, which is further segmented into a plurality of superpixels. The edge identification process is applied to the SAR image comprising the superpixels and edges.