The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 12, 2016
Filed:
Jan. 31, 2012
Gabriel Banarie, Murroe, IE;
Andreas Callanan, Murroe, IE;
Damien Mccartney, Raheen, IE;
Colin Lyden, Baltimore, IE;
Gabriel Banarie, Murroe, IE;
Andreas Callanan, Murroe, IE;
Damien McCartney, Raheen, IE;
Colin Lyden, Baltimore, IE;
Analog Devices, Inc., Norwood, MA (US);
Abstract
Techniques to provide calibration of a measurement system in conjunction with measurement operations. The techniques may include providing a reference device in a signal processing chain within the measurement system. An excitation signal may be driven through the reference device while it may be connected to the signal processing chain within the measurement system and a calibration response may be captured. During a measurement operation, the reference device connection may be complemented with a sensor connection in the signal processing chain and the excitation signal may be driven through the signal processing chain. A measurement response may be captured from the system. The measurement system may generate a calibrated measurement signal that accounts for phase and/or amplitude errors within the system from the calibration response and the measurement response.