The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 12, 2016

Filed:

Sep. 05, 2013
Applicant:

Samsung Display Co., Ltd., Yongin, Gyeonggi-Do, KR;

Inventors:

Alexander Voronov, Yongin, RU;

Gyoo-Wan Han, Yongin, KR;

Ji-Hun Jung, Yongin, KR;

Assignee:

Samsung Display Co., Ltd., Yongin-si, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 27/08 (2006.01); G01N 27/20 (2006.01); G01N 27/02 (2006.01); G01N 19/08 (2006.01); G01N 21/88 (2006.01); G01N 23/18 (2006.01);
U.S. Cl.
CPC ...
G01N 27/20 (2013.01); G01N 27/02 (2013.01); G01N 19/08 (2013.01); G01N 21/88 (2013.01); G01N 23/18 (2013.01);
Abstract

A method for detecting a defect of a barrier film includes preparing a device including an electrode and a barrier film covering the electrode, allowing a charged medium to contact a surface of the barrier film, and measuring a change in a flow of current between the charged medium and the electrode.


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