The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 12, 2016
Filed:
Mar. 03, 2014
Applicant:
Seiko Epson Corporation, Tokyo, JP;
Inventor:
Mamoru Sugimoto, Chino, JP;
Assignee:
Seiko Epson Corporation, , JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 4/00 (2006.01); G01N 21/552 (2014.01); G01N 21/01 (2006.01); G01N 21/21 (2006.01); G01N 21/65 (2006.01);
U.S. Cl.
CPC ...
G01N 21/553 (2013.01); G01N 21/01 (2013.01); G01N 21/21 (2013.01); G01N 21/554 (2013.01); G01N 21/65 (2013.01); G01N 21/658 (2013.01); Y10T 29/49826 (2015.01);
Abstract
An analysis device includes an optical element which includes a metal layer, a light transmitting layer on the metal layer, and a plurality of metal particles on the light transmitting layer arranged at a first interval P1 in a first direction and arranged at a second interval P2 in a second direction intersecting the first direction, P1<P2≦Q+P1, a light source which irradiates incident light of linearly polarized light in the first direction onto the optical element, and a detector which detects light emitted from the optical element. Where Q represents the interval between diffraction gratings.