The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 12, 2016

Filed:

Jun. 18, 2014
Applicant:

Weatherford/lamb, Inc., Houston, TX (US);

Inventors:

Domino Taverner, Wallingford, CT (US);

John J. Grunbeck, Northford, CT (US);

Jason Scott Kiddy, Gambrills, MD (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/47 (2006.01); G01M 11/00 (2006.01); G01M 11/02 (2006.01); E21B 47/00 (2012.01); G01D 5/353 (2006.01);
U.S. Cl.
CPC ...
G01N 21/4788 (2013.01); E21B 47/0002 (2013.01); G01D 5/3539 (2013.01); G01D 5/35383 (2013.01); G01M 11/02 (2013.01); G01M 11/33 (2013.01); G01N 2201/061 (2013.01); G01N 2201/0696 (2013.01); G01N 2201/08 (2013.01);
Abstract

Methods and apparatus for interrogating sets of optical elements having characteristic wavelengths spanning a sweep range while avoiding overlapping reflections from the different sets when performing a wavelength sweep are provided. One example method generally includes introducing a pulse of light, by an optical source, into an optical waveguide to interrogate at least first and second sets of optical elements, wherein the optical elements within each set have different characteristic wavelengths and wherein the first and second sets are separated in time such that a first time window over which light is reflected from the optical elements in the first set and reaches a receiver does not overlap with a second time window over which light is reflected from the optical elements in the second set and reaches the receiver; and processing the reflected light to determine one or more parameters corresponding to the optical elements.


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