The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 12, 2016
Filed:
Oct. 01, 2015
Laxco, Inc., Bothell, WA (US);
Cong Liang Chen, Woodinville, WA (US);
Kevin Cassady, Monroe, WA (US);
LAXCO, INC., Bothell, WA (US);
Abstract
An analytical instrument may have multiple distinct channels. Such may include one or more illumination sources and sensors. Illumination may be delivered to specific locations of a specimen holder, and returned illumination may be delivered to specific locations of a sensor array. Illumination may first pass a specimen, and a mirror or reflector may then return the illumination past the specimen. Optical splitters may be employed to couple pairs of fiber optics proximate a specimen holder. Such channels may further include a plurality of illumination sources positioned on one side of a specimen holder and a plurality of sensors on the other side. The plurality of sensor may capture image of a specimen and a spectrophotometer may concurrently scan the specimen. A plurality of specimens may be imaged and scanned in a single pass of a plurality of passes. Spherical or ball lenses may be placed in an optical path of the illumination to achieve a desired illumination pattern.