The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 12, 2016

Filed:

Sep. 12, 2012
Applicants:

Tadashi Kameyama, Kanagawa, JP;

Takanobu Naruse, Kanagawa, JP;

Takayasu Ito, Kanagawa, JP;

Inventors:

Tadashi Kameyama, Kanagawa, JP;

Takanobu Naruse, Kanagawa, JP;

Takayasu Ito, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01K 7/01 (2006.01); G01K 1/00 (2006.01); G01K 15/00 (2006.01); G01K 7/00 (2006.01);
U.S. Cl.
CPC ...
G01K 7/01 (2013.01); G01K 1/00 (2013.01); G01K 15/00 (2013.01); G01K 7/00 (2013.01);
Abstract

A temperature sensor in a semiconductor device includes a temperature detection circuit for outputting a voltage according to the chip temperature, a reference voltage generating circuit for generating a plurality of reference voltages, and a plurality of voltage comparators for comparing each reference voltage with an output voltage of the temperature detection circuit and thereby generating a chip temperature detection signal configured with multiple bits. Further, the temperature sensor includes a control circuit for controlling the reference voltages generated by the reference voltage generating circuit based on the chip temperature detection signal and thereby changing correspondence between the chip temperature detection signal and the chip temperature to shift a chip temperature detection range. It is possible to expand the chip temperature detection range by changing the correspondence between the chip temperature detection signal and the chip temperature, without increasing the number of voltage comparators.


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