The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 12, 2016
Filed:
Nov. 08, 2013
Dr. Johannes Heidenhain Gmbh, Traunreut, DE;
Wolfgang Holzapfel, Obing, DE;
Joerg Drescher, Samerberg, DE;
Markus Meissner, Uebersee, DE;
Ralph Joerger, Traunstein, DE;
Bernhard Musch, Traunreut, DE;
Thomas Kaelberer, Schrobenhausen, DE;
DR. JOHANNES HEIDENHAIN GMBH, Traunreut, DE;
Abstract
An optical position measuring instrument including a first scale having a first graduation, wherein the first scale is disposed movable in a first measuring direction, and at a first defined position in the first measuring direction, the first scale includes a spatially limited first marking that differs from the first graduation. The optical position measuring instrument further including a second scale having a second graduation, wherein the second scale is disposed movable in a second measuring direction, and at a second defined position, the second scale includes a second reference marking that is usable for generating at least one reference signal at a reference position of the second scale only if the first scale is located in the first defined position.