The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 12, 2016
Filed:
Sep. 17, 2015
Applicant:
Skycatch, Inc., San Francisco, CA (US);
Inventors:
David Chen, San Francisco, CA (US);
Ambar Pansari, San Francisco, CA (US);
Christian Sanz, San Francisco, CA (US);
Leonardo Felipe Romo Morales, Jalisco, MX;
Assignee:
SKYCATCH, INC., San Francisco, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01C 21/00 (2006.01); G01C 21/20 (2006.01);
U.S. Cl.
CPC ...
G01C 21/00 (2013.01); G01C 21/20 (2013.01);
Abstract
The present disclosure is directed toward systems and methods for identifying changes to a target site based on aerial images of the target site. For example, systems and methods described herein generate representations of the target site based on aerial photographs provided by an unmanned aerial vehicle. In one or more embodiments, systems and method described herein identify differences between the generated representations in order to detect changes that have occurred at the target site.