The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 12, 2016
Filed:
Jan. 03, 2014
Applicant:
Seiko Epson Corporation, Tokyo, JP;
Inventors:
Hiroshi Takiguchi, Matsumoto, JP;
Katsuyuki Moriya, Azumino, JP;
Osamu Kasuga, Suwa, JP;
Akira Sugawara, Tsuruoka, JP;
Assignee:
SEIKO EPSON CORPORATION, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B41J 29/393 (2006.01); B41J 2/01 (2006.01); B41M 5/40 (2006.01); B41J 2/045 (2006.01); D21H 19/00 (2006.01); B41J 2/21 (2006.01); B41M 5/52 (2006.01); C09D 11/36 (2014.01);
U.S. Cl.
CPC ...
B41J 2/0456 (2013.01); B41J 2/2142 (2013.01); B41M 5/52 (2013.01); B41M 5/529 (2013.01); B41M 5/5254 (2013.01); C09D 11/36 (2013.01); D21H 19/00 (2013.01);
Abstract
A test method includes preparing a test medium including a base and an ink-receiving layer that absorbs ink to swell in the thickness direction thereof, applying an ink onto the ink-receiving layer by ejecting droplets of the ink from a liquid ejecting apparatus, and observing the test medium.