The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 12, 2016

Filed:

Jun. 15, 2011
Applicants:

Robert E Andrews, Sheboygan, WI (US);

Jeff W Fritz, Plymouth, WI (US);

Jason Hohm, Sheboygan Falls, WI (US);

Song Sayaovong, Glendale, WI (US);

Peter Strains, Sheboygan Falls, WI (US);

Donald R Dodelin, Woodstock, GA (US);

Inventors:

Robert E Andrews, Sheboygan, WI (US);

Jeff W Fritz, Plymouth, WI (US);

Jason Hohm, Sheboygan Falls, WI (US);

Song Sayaovong, Glendale, WI (US);

Peter Strains, Sheboygan Falls, WI (US);

Donald R Dodelin, Woodstock, GA (US);

Assignee:

Curt G. Joa, Inc., Sheboygan Falls, WI (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B65H 20/14 (2006.01); A61F 13/15 (2006.01); B65H 39/16 (2006.01); B65H 20/34 (2006.01); B65H 20/32 (2006.01); B65H 23/24 (2006.01);
U.S. Cl.
CPC ...
A61F 13/15772 (2013.01); A61F 13/15 (2013.01); A61F 13/15577 (2013.01); A61F 13/15699 (2013.01); B65H 20/14 (2013.01); B65H 20/32 (2013.01); B65H 20/34 (2013.01); B65H 23/24 (2013.01); B65H 39/16 (2013.01); B65H 2301/52202 (2013.01);
Abstract

Apparatus and methods are provided to minimize waste and improve quality and production in web processing operations. A first non-elastomeric layer is bonded with an elastomeric layer, and to a second non-elastomeric layer. The apparatus and methods provide defect detection in the elastomeric layer and triggers an unthreading/rethreading sequence. Web defect detection may be provided by way of at least one visual inspection station. If defects are detected in the elastic layer, the resulting products may be culled.


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