The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 12, 2016

Filed:

Jan. 29, 2014
Applicant:

GE Medical Systems Global Technology Company, Llc, Waukesha, WI (US);

Inventors:

Xue Li Wang, Beijing, CN;

Zhenhua Xu, Beijing, CN;

Jun Li, Chengdu, CN;

Ximiao Cao, Beijing, CN;

Bin Wang, ChengDu, CN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01); A61B 6/03 (2006.01);
U.S. Cl.
CPC ...
A61B 6/032 (2013.01); A61B 6/4233 (2013.01); A61B 6/5205 (2013.01); A61B 6/5258 (2013.01); A61B 6/583 (2013.01);
Abstract

A method for automatically determining the best effective reconstruction gap, the method including scanning a phantom to collect image data of the phantom, using a plurality of different gap values to reconstruct image of the phantom respectively, based on the image data, thus obtaining a plurality of images respectively associated with different gap values, selecting the best image from the plurality of images, and automatically determining the gap value associated with the best image, and save it as the best effective reconstruction gap.


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